Assessing the Health of Your Advanced Process Control (APC) Applications
Wednesday, June 25, 2008
1:30 PM - 2:30 PM (GMT -04:00) Eastern Time (USA, Canada)
Language: English
Webcast Information
Advanced Process Control (APC) systems ensure plants are controlled at their most profitable constraints Having the ability to continuously monitor and assess APC performance as well as allowing MPC engineers to measure CV and MV performance simultaneously will provide significant time and resource advantages.
Using a condition-based methodology ensures APC applications such as MPC (model predictive controls) are monitored for any performance changes and that performance and diagnostic measurements can be readily and easily interpreted by personnel.
Some benefits include:
- Improved and sustainable APC utilization and performance
- Reduced APC-troubleshooting time by as much as 50%
- Integrated regulatory & analyzer monitoring
Attend this webcast and find out how a condition-based methodology will help you manage, enhance and sustain the benefits of all regulatory and advanced control systems.
Instructor Information
Rohit Patwardhan
Ph.D., P. Eng.
Dr. Rohit Patwardhan is responsible for Control Performance Monitoring Solutions in the EMEA region. He has over 11 years of experience in APC, regulatory control design and deployment, optimization and process troubleshooting in different industries. He is the former product manager for the Matrikon Control Performance Monitoring suite of products.