Assessing the Health of Your Advanced Process Control (APC) Applications
Wednesday, June 25, 2008
1:30 PM - 2:30 PM (GMT -04:00) Eastern Time (USA, Canada)
Language: English
Webcast Information
Advanced Process Control (APC) systems ensure plants are controlled at their most profitable constraints Having the ability to continuously monitor and assess APC performance as well as allowing MPC engineers to measure CV and MV performance simultaneously will provide significant time and resource advantages.
Using a condition-based methodology ensures APC applications such as MPC (model predictive controls) are monitored for any performance changes and that performance and diagnostic measurements can be readily and easily interpreted by personnel.
Some benefits include:
- Improved and sustainable APC utilization and performance
- Reduced APC-troubleshooting time by as much as 50%
- Integrated regulatory & analyzer monitoring
Attend this webcast and find out how a condition-based methodology will help you manage, enhance and sustain the benefits of all regulatory and advanced control systems.
Instructor Information
Rohit Patwardhan
Ph.D., P. Eng.
Dr. Rohit Patwardhan has worked in the broad area of automation with specific focus on advanced process control for over 8 years. His research interests lie in the area of model predictive control, system identification and process monitoring. He has published several papers in scientific journals and conferences on these topics.